Advanced Materials Characterization

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys thin films powders nanocomposites polymers shape memory alloys high entropy alloys and so on. Major instruments covered include X-ray diffraction near-field scanning optical microscopy Raman X-ray photospectroscopy ultraviolet-visible-near-infrared spectrosphotometer Fourier-transform infrared spectroscopy differential scanning calorimeter profilometer and thermogravimetric analysis. Features: Covers material characterization techniques and the development of advanced characterization technology Includes multiple length scale characterization approaches for a large variety of materials from nano- to micron-scale as well as their constraints Discusses advanced material characterization technology in the microstructural and property characterization fields Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties Offers fundamentals basic instrumentation details experimental approaches analyses and applications with case studies This book is aimed at graduate students and researchers in materials science and engineering. . Language: English